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Gatan: Ilion II System Scanning Electron Microscope (SEM) Specimen Preparation (RRID:SCR_019934)Copy Citation Copied
URL: https://www.gatan.com/products/sem-specimen-preparation/ilion-ii-system
Proper Citation: Gatan: Ilion II System Scanning Electron Microscope (SEM) Specimen Preparation (RRID:SCR_019934)
Description: Microscope accessory that is used for low energy surface preparation for SEM cross section viewing.
Resource Type: instrument resource
Keywords: Gatan, SEM Specimen Preparation, Instrument Equipment, USEDit,
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