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URL: https://nano.oxinst.com/ultim-extreme
Proper Citation: Oxford: Ultim Extreme Electron Microscopy (RRID:SCR_020388)
Description: Ultra high resolution FEG SEM application and delivers solutions beyond micro and nano analysis. It uses radical geometry for both imaging and EDS performance in ultra high resolution FEG SEMs while working at low kV and short working distance, with EDS resolution that approaches that of SEM.
Resource Type: instrument resource
Keywords: Oxford, Electron Microscopy, Instrument, Resource equipment, Equipment, USEDit,
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