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URL: https://nano.oxinst.com/products/ebsd/symmetry
Proper Citation: Oxford: Symmetry Electron Microscopy (RRID:SCR_020390)
Description: Symmetry uses customised CMOS sensor to unlock combination of speed, sensitivity and diffraction pattern detail.
Resource Type: instrument resource
Keywords: Oxford, Electron Microscopy, Instrument, Resource equipment, Equipment, USEDit,
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