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https://www.fei.com/products/tem/krios-g3i-cryo-tem-for-life-sciences/

Transmission electron microscope that is used for automated applications such as single particle analysis, cryo-electron tomography, and micro electron diffraction.

Proper citation: FEI: Krios G4 Cryo-TEM (RRID:SCR_019887) Copy   

•   Source: SciCrunch Registry

https://www.thermofisher.com/us/en/home/electron-microscopy/products/dualbeam-fib-sem-microscopes/aquilos-2-cryo-fib.html

Sample preparation tool used for the preparation of thin, electron transparent lamellas for high resolution cryo electron tomography or MicroED of micro crystals.

Proper citation: Thermo Fisher: FEI Aquilos 2 Cryo-FIB for Life Sciences (RRID:SCR_019880) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/efa/flexprober-for-semiconductors/

Nanoprobing platform that provides electrical characterization and fault isolation capabilities for process development, device design debug, and failure analysis.

Proper citation: FEI: flexProber System for Semiconductors (RRID:SCR_019881) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/sem/phenom-pure/

Desktop scanning electron microscope that provides high-quality images and features autofocus and automated source alignments.

Proper citation: FEI: Phenom Pure Desktop SEM (RRID:SCR_019899) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/fib/optifib-taipan-for-semiconductors/

Focused ion beam system that for semiconductors that enables a highly controlled beam profile and current, accurate navigation and ion beam placement, and reliable end-pointing.

Proper citation: FEI: OptiFIB Taipan for Semiconductors (RRID:SCR_019895) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/sem/phenom-gsr/

Desktop scanning electron microscope that is used to scan sample and find suspect gunshot residue particles. If suspect particle is found, Energy Dispersive Spectroscopy technique is used to identify elements in that particle.

Proper citation: FEI: Phenom GSR Desktop SEM (RRID:SCR_019896) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/efa/meridian-m-for-semiconductors/

Electrical failure analysis system for semiconductors that uses high sensitivity broadband DBX photon emission and Static Laser Stimulation techniques to pinpoint the location of electrical faults.

Proper citation: FEI: Meridian M System for Semiconductors (RRID:SCR_019897) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/efa/meridian-ws-dp-for-semiconductors/

Electrical failure analysis system for semiconductors that enables faster defect localization by using production testers, load boards, and probe cards.

Proper citation: FEI: Meridian WS-DP System for Semiconductors (RRID:SCR_019890) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/sem/quattro-for-materials-science/

Scanning electron microscope that combines a field emission gun (FEG) and three vacuum modes (high vacuum, low vacuum, and ESEM) to provide the flexibility to accommodate a wide range of samples, including those that are outgassing or otherwise not vacuum-compatible.

Proper citation: FEI: Quattro ESEM (RRID:SCR_019901) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/tem/talos-f200x-for-materials-science/

Transmission electron microscope that combines high-resolution STEM and TEM imaging with energy dispersive X-ray spectroscopy signal detection.

Proper citation: FEI: Talos F200X G2 TEM and STEM (RRID:SCR_019907) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/tem/themis-s-for-semiconductors/

Scanning/transmission electron microscope that is designed for high-speed imaging and analysis of semiconductor devices.

Proper citation: FEI: Themis S S/TEM for Semiconductors (RRID:SCR_019909) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/tem/talos-for-life-sciences/

Microscope that is designed for performance and productivity across a wide range of samples and applications, such as 2D and 3D imaging of cells, organelles, asbestos, polymers, and soft materials, both at ambient and cryogenic temperatures.

Proper citation: FEI: Talos F200C TEM and STEM (Scanning/Transmission Electron Microscope) (RRID:SCR_019903) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/sem/prisma-esem-for-materials-science/

Scanning electron microscope that is used for industrial research and development with environmental SEM capability.

Proper citation: FEI: Prisma E SEM (RRID:SCR_019904) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/tem/talos-arctica-for-life-sciences/

Transmission electron microscope that is built for delivering high-resolution 3D characterization of biological samples and biomaterials in cell biology, structural biology, and nanotechnology research.

Proper citation: FEI: Talos Arctica Cryo-TEM (RRID:SCR_019905) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/tem/talos-f200s-for-materials-science/

TEM and STEM microscope for dynamic microscopy.

Proper citation: FEI: Talos F200S G2 TEM and STEM (RRID:SCR_019906) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/tem/themis-z-for-materials-science/

Next generation, ultra-high resolution, aberration corrected, scanning transmission electron microscope delivering the ultimate optical performance and flexibility with unprecedented reproducibility.

Proper citation: FEI: Themis Z for Materials Science (RRID:SCR_019910) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/sem/apreo-sem-for-life-sciences/

Scanning electron microscope that provides a sub-nanometer or all-around nanometer resolution performance on materials spanning from catalysts, powders, nanoparticles, and bulk magnetic samples to nanodevices.

Proper citation: FEI: Apreo SEM (Scanning Electron Microscope) for Life Sciences (RRID:SCR_019879) Copy   

•   Source: SciCrunch Registry

https://www.fei.com/products/fib/v400ace-focused-ion-beam-for-semiconductors/

Focused ion beam system that can be configured for backside editing with an optional IR microscope and bulk silicon trenching package.

Proper citation: FEI: V400ACE Focused Ion Beam for Semiconductors (RRID:SCR_019912) Copy   

•   Source: SciCrunch Registry

https://www.fishersci.com/shop/products/femtojet-4i-microinjector/E5252000021

THIS RESOURCE IS NO LONGER IN SERVICE. Documented on November 14,2023. Eppendorf's electronic microinjectors FemtoJet 4i and FemtoJet 4x with their operation menu and a range of functionalities are perfectly suited for injecting small to intermediate volumes. With a built-in compressor, the FemtoJet 4i is the tool of choice for injecting aqueous solutions into adherent cells and suspension cells. If your research demands injecting volumes greater than 100 pL and/or longer series at higher pressures, FemtoJet 4x with its external pressure supply (not included) delivers the precise and continuous pressure required. Featuring the same quality design and compatibility features as the FemtoJet 4i, the FemtoJet 4x is the "heavy duty" device for those more demanding applications. Both the FemtoJet 4i and FemtoJet 4x, form the system with Eppendorf micromanipulators, yet they integrate just as easily with non-Eppendorf micromanipulation systems. The electronic connection between FemtoJet 4i or 4x and TransferMan 4r or InjectMan 4 guarantees simple, rapid and reproducible microinjections into cells, simplifying your daily work and speeding up your workflow. The FemtoJet 4i/ 4x injectors are for research use only.

Proper citation: Eppendorf: FemtoJet 4i (RRID:SCR_019870) Copy   

•   Source: SciCrunch Registry

http://harvard.eagle-i.net/i/00000130-d6cd-1ce1-8a1b-bf0e80000000

E-beam evaporator recommended for oxide and nitride materials. Designed to operate around the e-5 millibar vacuum range, EE-2 can also be used to deposit metals (non-toxic materials) if very low pressure is not a critical factor in your process. The water-cooled substrate holder can accommodate one wafer up to 3� diameter. EE-2 has a rotary-vane mechanical roughing pump and a turbo high-vacuum pump, and is a relatively low voltage (~3.8kV) electron beam evaporation deposition system with a 4-pocket, water-cooled rotating hearth.

Proper citation: Edwards: Auto 306 e-beam Evaporator (RRID:SCR_019844) Copy   

•   Source: SciCrunch Registry