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| Resource Name | Proper Citation | Abbreviations | Resource Type |
Description |
Keywords | Resource Relationships | |||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
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FEI: Krios G4 Cryo-TEM Resource Report Resource Website 1+ mentions |
FEI: Krios G4 Cryo-TEM (RRID:SCR_019887) | instrument resource | Transmission electron microscope that is used for automated applications such as single particle analysis, cryo-electron tomography, and micro electron diffraction. | FEI, TEM, Instrument Equipment, USEDit, | Commercially available | Model_Number_Krios G4 | SCR_019887 | 2026-08-01 12:06:39 | 1 | ||||||||||
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Thermo Fisher: FEI Aquilos 2 Cryo-FIB for Life Sciences Resource Report Resource Website 1+ mentions |
Thermo Fisher: FEI Aquilos 2 Cryo-FIB for Life Sciences (RRID:SCR_019880) | instrument resource | Sample preparation tool used for the preparation of thin, electron transparent lamellas for high resolution cryo electron tomography or MicroED of micro crystals. | FEI, DualBeam Microscope, Instrument Equipment, USEDit, | Commercially available | Model_Number_Aquilos 2 | SCR_019880 | 2026-08-01 12:06:47 | 1 | ||||||||||
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FEI: flexProber System for Semiconductors Resource Report Resource Website |
FEI: flexProber System for Semiconductors (RRID:SCR_019881) | instrument resource | Nanoprobing platform that provides electrical characterization and fault isolation capabilities for process development, device design debug, and failure analysis. | FEI, EFA System, Instrument Equipment, USEDit, | Commercially available | Model_Number_flexProber | SCR_019881 | 2026-08-01 12:06:47 | 0 | ||||||||||
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FEI: Phenom Pure Desktop SEM Resource Report Resource Website |
FEI: Phenom Pure Desktop SEM (RRID:SCR_019899) | instrument resource | Desktop scanning electron microscope that provides high-quality images and features autofocus and automated source alignments. | FEI, SEM, Instrument Equipment, USEDit, | Commercially available | Model_Number_Phenom Pure | SCR_019899 | 2026-08-01 12:06:39 | 0 | ||||||||||
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FEI: OptiFIB Taipan for Semiconductors Resource Report Resource Website |
FEI: OptiFIB Taipan for Semiconductors (RRID:SCR_019895) | instrument resource | Focused ion beam system that for semiconductors that enables a highly controlled beam profile and current, accurate navigation and ion beam placement, and reliable end-pointing. | FEI, FIB Microscope, Instrument Equipment, USEDit, | Commercially available | Model_Number_OptiFIB | SCR_019895 | 2026-08-01 12:06:39 | 0 | ||||||||||
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FEI: Phenom GSR Desktop SEM Resource Report Resource Website |
FEI: Phenom GSR Desktop SEM (RRID:SCR_019896) | instrument resource | Desktop scanning electron microscope that is used to scan sample and find suspect gunshot residue particles. If suspect particle is found, Energy Dispersive Spectroscopy technique is used to identify elements in that particle. | FEI, SEM, Instrument Equipment, USEDit, | Commercially available | Model_Number_Phenom GSR | SCR_019896 | 2026-08-01 12:06:48 | 0 | ||||||||||
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FEI: Meridian M System for Semiconductors Resource Report Resource Website |
FEI: Meridian M System for Semiconductors (RRID:SCR_019897) | instrument resource | Electrical failure analysis system for semiconductors that uses high sensitivity broadband DBX photon emission and Static Laser Stimulation techniques to pinpoint the location of electrical faults. | FEI, EFA System, Instrument Equipment, USEDit, | Commercially available | Model_Number_Meridian_M | SCR_019897 | 2026-08-01 12:06:35 | 0 | ||||||||||
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FEI: Meridian WS-DP System for Semiconductors Resource Report Resource Website |
FEI: Meridian WS-DP System for Semiconductors (RRID:SCR_019890) | instrument resource | Electrical failure analysis system for semiconductors that enables faster defect localization by using production testers, load boards, and probe cards. | FEI, EFA System, Instrument Equipment, USEDit, | Commercially available | Model_Number_Meridian_WS_DP | SCR_019890 | 2026-08-01 12:06:48 | 0 | ||||||||||
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FEI: Quattro ESEM Resource Report Resource Website |
FEI: Quattro ESEM (RRID:SCR_019901) | instrument resource | Scanning electron microscope that combines a field emission gun (FEG) and three vacuum modes (high vacuum, low vacuum, and ESEM) to provide the flexibility to accommodate a wide range of samples, including those that are outgassing or otherwise not vacuum-compatible. | FEI, SEM, Instrument Equipment, USEDit, Environmental Scanning Electron Microscope, electron microscope, | Commercially available | Model_Number_Quattro_ESEM | SCR_019901 | 2026-08-01 12:06:48 | 0 | ||||||||||
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FEI: Talos F200X G2 TEM and STEM Resource Report Resource Website |
FEI: Talos F200X G2 TEM and STEM (RRID:SCR_019907) | instrument resource | Transmission electron microscope that combines high-resolution STEM and TEM imaging with energy dispersive X-ray spectroscopy signal detection. | FEI, TEM, Instrument Equipment, USEDit, | Commercially available | Model_Number_F200X | SCR_019907 | 2026-08-01 12:06:39 | 0 | ||||||||||
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FEI: Themis S S/TEM for Semiconductors Resource Report Resource Website |
FEI: Themis S S/TEM for Semiconductors (RRID:SCR_019909) | instrument resource | Scanning/transmission electron microscope that is designed for high-speed imaging and analysis of semiconductor devices. | FEI, TEM, Instrument Equipment, USEDit, | Commercially available | Model_Number_Themis S | SCR_019909 | 2026-08-01 12:06:48 | 0 | ||||||||||
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FEI: Talos F200C TEM and STEM (Scanning/Transmission Electron Microscope) Resource Report Resource Website |
FEI: Talos F200C TEM and STEM (Scanning/Transmission Electron Microscope) (RRID:SCR_019903) | instrument resource | Microscope that is designed for performance and productivity across a wide range of samples and applications, such as 2D and 3D imaging of cells, organelles, asbestos, polymers, and soft materials, both at ambient and cryogenic temperatures. | FEI, TEM, Instrument Equipment, USEDit, | Commercially available | Model_Number_F200C | SCR_019903 | 2026-08-01 12:06:39 | 0 | ||||||||||
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FEI: Prisma E SEM Resource Report Resource Website |
FEI: Prisma E SEM (RRID:SCR_019904) | instrument resource | Scanning electron microscope that is used for industrial research and development with environmental SEM capability. | FEI, SEM, Instrument Equipment, USEDit, | Commercially available | Model_Number_Prisma E | SCR_019904 | 2026-08-01 12:06:35 | 0 | ||||||||||
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FEI: Talos Arctica Cryo-TEM Resource Report Resource Website 1+ mentions |
FEI: Talos Arctica Cryo-TEM (RRID:SCR_019905) | instrument resource | Transmission electron microscope that is built for delivering high-resolution 3D characterization of biological samples and biomaterials in cell biology, structural biology, and nanotechnology research. | FEI, TEM, Instrument Equipment, USEDit, | Commercially available | Model_Number_Talos Arctica | SCR_019905 | 2026-08-01 12:06:48 | 1 | ||||||||||
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FEI: Talos F200S G2 TEM and STEM Resource Report Resource Website 1+ mentions |
FEI: Talos F200S G2 TEM and STEM (RRID:SCR_019906) | instrument resource | TEM and STEM microscope for dynamic microscopy. | FEI, TEM, Instrument Equipment, USEDit, | Commercially available | Model_Number_F200S | SCR_019906 | 2026-08-01 12:06:48 | 1 | ||||||||||
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FEI: Themis Z for Materials Science Resource Report Resource Website |
FEI: Themis Z for Materials Science (RRID:SCR_019910) | instrument resource | Next generation, ultra-high resolution, aberration corrected, scanning transmission electron microscope delivering the ultimate optical performance and flexibility with unprecedented reproducibility. | FEI, TEM, Instrument Equipment, USEDit, | Commercially available | Model_Number_Themis Z | SCR_019910 | 2026-08-01 12:06:39 | 0 | ||||||||||
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FEI: Apreo SEM (Scanning Electron Microscope) for Life Sciences Resource Report Resource Website |
FEI: Apreo SEM (Scanning Electron Microscope) for Life Sciences (RRID:SCR_019879) | instrument resource | Scanning electron microscope that provides a sub-nanometer or all-around nanometer resolution performance on materials spanning from catalysts, powders, nanoparticles, and bulk magnetic samples to nanodevices. | FEI, SEM, Instrument Equipment, USEDit, | Commercially available | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_019879.pdf | Model_Number_Apreo | SCR_019879 | 2026-08-01 12:06:34 | 0 | |||||||||
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FEI: V400ACE Focused Ion Beam for Semiconductors Resource Report Resource Website |
FEI: V400ACE Focused Ion Beam for Semiconductors (RRID:SCR_019912) | instrument resource | Focused ion beam system that can be configured for backside editing with an optional IR microscope and bulk silicon trenching package. | FEI, FIB Microscope, Instrument Equipment, USEDit, | Commercially available | Model_Number_V400ACE | SCR_019912 | 2026-08-01 12:06:35 | 0 | ||||||||||
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Eppendorf: FemtoJet 4i Resource Report Resource Website |
Eppendorf: FemtoJet 4i (RRID:SCR_019870) | instrument resource | THIS RESOURCE IS NO LONGER IN SERVICE. Documented on November 14,2023. Eppendorf's electronic microinjectors FemtoJet 4i and FemtoJet 4x with their operation menu and a range of functionalities are perfectly suited for injecting small to intermediate volumes. With a built-in compressor, the FemtoJet 4i is the tool of choice for injecting aqueous solutions into adherent cells and suspension cells. If your research demands injecting volumes greater than 100 pL and/or longer series at higher pressures, FemtoJet 4x with its external pressure supply (not included) delivers the precise and continuous pressure required. Featuring the same quality design and compatibility features as the FemtoJet 4i, the FemtoJet 4x is the "heavy duty" device for those more demanding applications. Both the FemtoJet 4i and FemtoJet 4x, form the system with Eppendorf micromanipulators, yet they integrate just as easily with non-Eppendorf micromanipulation systems. The electronic connection between FemtoJet 4i or 4x and TransferMan 4r or InjectMan 4 guarantees simple, rapid and reproducible microinjections into cells, simplifying your daily work and speeding up your workflow. The FemtoJet 4i/ 4x injectors are for research use only. | Eppendorf, electronic microinjector, Instrument Equipment, USEDit | THIS RESOURCE IS NO LONGER IN SERVICE | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_019870.pdf | Model_Number_4i | https://online-shop.eppendorf.us/US-en/Cell-Manipulation-44522/Microinjection-44526/FemtoJet4i-and-FemtoJet4x-PF-67155.html | SCR_019870 | 2026-08-01 12:06:39 | 0 | ||||||||
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Edwards: Auto 306 e-beam Evaporator Resource Report Resource Website |
Edwards: Auto 306 e-beam Evaporator (RRID:SCR_019844) | instrument resource | E-beam evaporator recommended for oxide and nitride materials. Designed to operate around the e-5 millibar vacuum range, EE-2 can also be used to deposit metals (non-toxic materials) if very low pressure is not a critical factor in your process. The water-cooled substrate holder can accommodate one wafer up to 3� diameter. EE-2 has a rotary-vane mechanical roughing pump and a turbo high-vacuum pump, and is a relatively low voltage (~3.8kV) electron beam evaporation deposition system with a 4-pocket, water-cooled rotating hearth. | Edwards, Evaporator, Instrument Equipment, USEDit | Commercially available | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_019844.pdf | Model_Number_306 | SCR_019844 | 2026-08-01 12:06:38 | 0 |
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