Searching the RRID Resource Information Network
Are you sure you want to leave this community? Leaving the community will revoke any permissions you have been granted in this community.
SciCrunch Registry is a curated repository of scientific resources, with a focus on biomedical resources, including tools, databases, and core facilities - visit SciCrunch to register your resource.
| Resource Name | Proper Citation | Abbreviations | Resource Type |
Description |
Keywords | Resource Relationships | |||||||||||||
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
|
Leica: APO S8 Microscope Resource Report Resource Website |
Leica: APO S8 Microscope (RRID:SCR_020209) | instrument resource | Greenough stereo microscope, Leica S8 APO with apochromatic 8:1 zoom and 75mm working distance allows easy access to specimen even at high magnification up to 80x which is best for quality control, cell sorting and microinjection applications. Ergonomic 38 viewing angle provides comfort, which helps increase productivity, reduce fatigue related inspection errors and acquire precise positioning while working with incident or transmitted light. Adjustable zoom stops allows fast, easy, repeatable measurements and inspections. The Integrated Documentation port allows to connect digital cameras. | Leica, Microscope, Instrument Equipment, USEDit | Commercially available | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_020209.pdf | Model_Number_APO S8 | SCR_020209 | 2026-08-01 12:06:45 | 0 | |||||||||
|
JEOL: JIB-4700F Focused Ion Beam Resource Report Resource Website |
JEOL: JIB-4700F Focused Ion Beam (RRID:SCR_020188) | instrument resource | Focused ion beam that can be used in morphological observations, elemental and crystallographic analyses of variety of specimens. | Jeol, JEOL, Focused Ion Beam, Instrument Equipment, USEDit, | Commercially available | Model_Number_JIB-4700F | SCR_020188 | 2026-08-01 12:06:53 | 0 | ||||||||||
|
JEOL: JSM-IT200 InTouchScope Scanning Electron Microscope (SEM) Resource Report Resource Website |
JEOL: JSM-IT200 InTouchScope Scanning Electron Microscope (SEM) (RRID:SCR_020186) | instrument resource | Scanning electron microscope that is compact and versatile and delivers high resolution imaging with unsurpassed low kV performance and high sensitivity solid state BSE detector included with LV models. | Jeol, JEOL, Scanning Electron Microscope, Instrument Equipment, USEDit, | Commercially available | Model_Number_JSM_IT200 | SCR_020186 | 2026-08-01 12:06:41 | 0 | ||||||||||
|
JEOL: JNM-ECZR Nuclear Magnetic Resonance (NMR) Spectrometer Resource Report Resource Website 1+ mentions |
JEOL: JNM-ECZR Nuclear Magnetic Resonance (NMR) Spectrometer (RRID:SCR_020183) | instrument resource | Nuclear magnetic resonance spectormeter that enables highly sophisticated measurements to be carried out while most routine measurement operations can be performed automatically. | Jeol, JEOL, Nuclear Magnetic Resonance Spectrometer, Instrument Equipment, USEDit, | Commercially available | Model_Number_JNM_ECZR | SCR_020183 | 2026-08-01 12:06:41 | 1 | ||||||||||
|
JEOL: JMS-Q1500GC Single-Quad Mass Spectrometer Resource Report Resource Website |
JEOL: JMS-Q1500GC Single-Quad Mass Spectrometer (RRID:SCR_020182) | instrument resource | Mass spectrometer that can be used for wide range of applications such as environmental analysis for agrichemicals and mold odor, material analysis, and aroma analysis. | Jeol, JEOL, Mass Spectrometer, Instrument, Equipment, USEDit | Commercially available | Model_Number_JMS_Q1500GC | SCR_020182 | 2026-08-01 12:06:45 | 0 | ||||||||||
|
Leica: DFC 452 Microscope Camera Resource Report Resource Website |
Leica: DFC 452 Microscope Camera (RRID:SCR_020215) | instrument resource | Leica DFC495 is a digital camera with 8 Megapixel CCD that quickly captures high-resolution images microscopy in life science.. The scan preview in SXGA resolution provides up to 18 frames per second (fps) and allows the sample to be adjusted and focussed directly on the computer screen. The Peltier cooling reduces noise for imaging in low light conditions. | Leica, Microscope Camera, Instrument Equipment, USEDit | Commercially available | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_020215.pdf | Model_Number_DFC 452 | SCR_020215 | 2026-08-01 12:06:53 | 0 | |||||||||
|
JEOL: JIB-4000PLUS Focused Ion Beam Resource Report Resource Website |
JEOL: JIB-4000PLUS Focused Ion Beam (RRID:SCR_020178) | instrument resource | Focused ion bean that is milling and imaging system featuring high performance ion optical column | Jeol, JEOL, Focused Ion Beam, Instrument Equipment, USEDit, | Commercially available | Model_Number_JIB-4000PLUS | SCR_020178 | 2026-08-01 12:06:45 | 0 | ||||||||||
|
Leica: Autostainer XL Automated Slide Stainer Resource Report Resource Website 1+ mentions |
Leica: Autostainer XL Automated Slide Stainer (RRID:SCR_020212) | instrument resource | Autostainer XL continues to provide reproducible, consistent, high-quality staining and increased workload throughput. Plus, combine it with the CV5030 Glass Coverslipper to create a workstation that eliminates the manual handling of slide racks between staining and coverslipping. Can be used stand-alone or integrated with the Leica CV5030 Glass Coverslipper to create a ‘walk-away, staining/coverslipping workstation. Upgrade at anytime to match your laboratory's specific needs. | Leica, Automated Slide Stainer, Instrument Equipment, USEDit | Commercially available | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_020212.pdf | Model_Number_Autostainer XL | SCR_020212 | 2026-08-01 12:06:45 | 4 | |||||||||
|
JEOL: AccuTOF LC-plus 4G Time-of-Flight Mass Spectrometer Resource Report Resource Website |
JEOL: AccuTOF LC-plus 4G Time-of-Flight Mass Spectrometer (RRID:SCR_020154) | instrument resource | Mass spectrometer with analyzer design that employs elegant ion optics and ADC based digitizer to deliver dynamic range exceeding 4 orders of magnitude, without compromising resolution or mass accuracy. | Jeol, JEOL, Mass Spectrometer, Instrument, Equipment, USEDit | Commercially available | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_020154.pdf | Model_Number_LC_plus_4G | SCR_020154 | 2026-08-01 12:06:44 | 0 | |||||||||
|
JEOL: 2100F Transmission Electron Microscope Resource Report Resource Website |
JEOL: 2100F Transmission Electron Microscope (RRID:SCR_020155) | instrument resource | JEM-2100F is a multipurpose, 200 kV FE (Field Emission) analytical electron microscope. Variety of versions is provided to adapt user's purposes. The FE electron gun (FEG) produces highly stable and bright electron probe that is never achieved with conventional thermionic electron gun. This feature is essential for ultrahigh resolution in scanning transmission microscopy and in an analysis of a nano-scaled sample. Various analytical instruments and/or cameras such as EDS (Energy Dispersive X-ray Spectrometer) or EELS (electron energy loss spectrometer) or CCD cameras are ready for integration with a PC system of the microscope control. | JEOL, Transmission Electron Microscope, Instrument Equipment, USEDit | Commercially available | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_020155.pdf | Model_Number_2100F | SCR_020155 | 2026-08-01 12:06:52 | 0 | |||||||||
|
JEOL: AccuTOF GCxGC Mass Spectrometer Resource Report Resource Website |
JEOL: AccuTOF GCxGC Mass Spectrometer (RRID:SCR_020151) | instrument resource | Mass spectrometer that offers both chromatographic separation and high resolution mass spectra. Offers variety of ion sources and features Instrument Detection Limit of 16 fg, statistically calculated from repeated injections of 100 fg octafluoronaphthalene. | Jeol, JEOL, Mass Spectrometer, Instrument, Equipment, USEDit | Commercially available | Model_Number_GCxGC | SCR_020151 | 2026-08-01 12:06:52 | 0 | ||||||||||
|
Thermo Fisher: Invitrogen: Countess Countess Resource Report Resource Website |
Thermo Fisher: Invitrogen: Countess Countess (RRID:SCR_020149) | instrument resource | Countess Automated Cell Counter from Invitrogen is a benchtop automated cell counter. It can perform cell counts as well as viability and cell calculations. The Countess has a touch screen display and allows data to be transferred via USB drive to a computer for data access and storage. | Invitrogen, Cell Counter, Instrument Equipment, USEDit | Commercially available | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_020149.pdf | Model_Number_Countess | SCR_020149 | 2026-08-01 12:06:44 | 0 | |||||||||
|
Jasco: J-815 Spectropolarimeter Resource Report Resource Website 1+ mentions |
Jasco: J-815 Spectropolarimeter (RRID:SCR_020145) | instrument resource | Circular dichroism (CD) spectroscopy measures differences in the absorption of left-handed polarized light versus right-handed polarized light that arise due to structural asymmetry. The absence of regular structure results in zero CD intensity, while an ordered structure results in a spectrum which can contain both positive and negative signals. | Jasco, Spectropolarimeter, Instrument Equipment, USEDit | Commercially available | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_020145.pdf | Model_Number_J-815 | SCR_020145 | 2026-08-01 12:06:52 | 9 | |||||||||
|
JEOL: JEM-100CX II Transmission Electron Microscope Resource Report Resource Website |
JEOL: JEM-100CX II Transmission Electron Microscope (RRID:SCR_020146) | instrument resource | THIS RESOURCE IS NO LONGER IN SERVICE. Documented on November 5,2023.JEOL JEM-100CX II transmission electron microscope is an electron microscope with imaging capabilities at low to high magnifications (90X to 800, 000X). A 10M-pixel HAMAMASTU C4742-95 digital camera is integrated to the system for high- image acquisition. | JEOL, Transmission Electron Microscope, Instrument Equipment, USEDit | THIS RESOURCE IS NO LONGER IN SERVICE | Model_Number_100CX II, SCR_020153 | SCR_020146 | 2026-08-01 12:06:44 | 0 | ||||||||||
|
JEOL: JBX-3050MV Electron Beam Lithography System Resource Report Resource Website |
JEOL: JBX-3050MV Electron Beam Lithography System (RRID:SCR_020166) | instrument resource | Electron beam lithography system for mask reticle fabrication that meets design rule of 45 to 32 nm and pattern writing with high speed, high accuracy and high reliability, achieved by high end technology | Jeol, JEOL, Electron Beam Lithography System, Instrument Equipment, USEDit, | Commercially available | Model_Number_JBX-3050MV | SCR_020166 | 2026-08-01 12:06:41 | 0 | ||||||||||
|
JEOL: CRYO ARM 300 Transmission Electron Microscope Resource Report Resource Website |
JEOL: CRYO ARM 300 Transmission Electron Microscope (RRID:SCR_020163) | instrument resource | Transmission electron microscope field emission cryo electron microscope that allows for automated detection of holes on specimen grid for automated, unattended acquisition of high resolution images | Jeol, JEOL, Transmission Electron Microscope, Instrument Equipment, USEDit, | is listed by: University of Florida Scripps Institute for Biomedical Innovation and Technology Structural Biology Cryo Electron Microscopy Core Facility | Commercially available | Model_Number_CRYO ARM 300 | SCR_020163 | 2026-08-01 12:06:52 | 0 | |||||||||
|
JEOL: ElementEye JSX-1000S XRF Fluorescence Spectrometer Resource Report Resource Website |
JEOL: ElementEye JSX-1000S XRF Fluorescence Spectrometer (RRID:SCR_020162) | instrument resource | Fluoresence spectormeer that analyzes major to trace components on most sample types solids, powders, liquids with little or no sample preparation | Jeol, JEOL, Florescence Spectrometer, Instrument Equipment, USEDit, | Commercially available | Model_Number_ElementEye JSX-1000S XRF | SCR_020162 | 2026-08-01 12:06:40 | 0 | ||||||||||
|
JEOL: EBG-300UA High Power Electron Beam Source Resource Report Resource Website |
JEOL: EBG-300UA High Power Electron Beam Source (RRID:SCR_020160) | instrument resource | High power electron beam source that is designed to uniformly deposit metal oxides onto wide plastic films or steel plates in continuous feed such as in magnetic tape manufacture for high density recording or in wrapping film manufacture with oxide barrier function | Jeol, JEOL, High Power Electron Beam Source, Instrument Equipment, USEDit, | Commercially available | Model_Number_EBG-300UA | SCR_020160 | 2026-08-01 12:06:44 | 0 | ||||||||||
|
JEOL: BS-80011BPG Plasma Source Resource Report Resource Website |
JEOL: BS-80011BPG Plasma Source (RRID:SCR_020158) | instrument resource | Plasma source that can be used as Ion Plating for thin films, especially optical thin films and with Film quality such as density, adhesion, flatness, index of refraction and absorption are improved by comparison with usual vacuum deposition method | Jeol, JEOL, Plasma Source, Instrument Equipment, USEDit, | Commercially available | https://raw.githubusercontent.com/SciCrunch/RRID-Instruments/main/PDF/SCR_020158.pdf | Model_Number_BS-80011BPG | SCR_020158 | 2026-08-01 12:06:52 | 0 | |||||||||
|
JEOL: ECX-300 Console Resource Report Resource Website |
JEOL: ECX-300 Console (RRID:SCR_020159) | instrument resource | Available from 300 to 500 MHz console is designed around modular, digital NMR electronics chassis controlled by intelligent acquisition computer. Both workstation and spectrometer may be connected to standard network, allowing seamless remote operation anywhere in world. | Jeol, JEOL, Mass Spectrometer, Instrument, Equipment, USEDit | Commercially available | Model_Number_ECX_300 | SCR_020159 | 2026-08-01 12:06:40 | 0 |
Can't find your Tool?
We recommend that you click next to the search bar to check some helpful tips on searches and refine your search firstly. Alternatively, please register your tool with the SciCrunch Registry by adding a little information to a web form, logging in will enable users to create a provisional RRID, but it not required to submit.
Welcome to the RRID Resources search. From here you can search through a compilation of resources used by RRID and see how data is organized within our community.
You are currently on the Community Resources tab looking through categories and sources that RRID has compiled. You can navigate through those categories from here or change to a different tab to execute your search through. Each tab gives a different perspective on data.
If you have an account on RRID then you can log in from here to get additional features in RRID such as Collections, Saved Searches, and managing Resources.
Here is the search term that is being executed, you can type in anything you want to search for. Some tips to help searching:
If you are logged into RRID you can add data records to your collections to create custom spreadsheets across multiple sources of data.
Here are the facets that you can filter the data by.
If you have any further questions please check out our FAQs Page to ask questions and see our tutorials. Click this button to view this tutorial again.
